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Two-dimensional x-ray diffraction

Bob B. He 1954-

Hoboken, N.J. Wiley c2009

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  • Título:
    Two-dimensional x-ray diffraction
  • Autor: Bob B. He 1954-
  • Assuntos: X-rays -- Diffraction; DIFRAÇÃO POR RAIOS X (EXPERIMENTOS); DIFRAÇÃO POR RAIOS X (APLICAÇÕES INDUSTRIAIS); X-rays -- Diffraction -- Experiments; X-rays -- Diffraction -- Industrial applications
  • Notas: Includes bibliographical references and index.
  • Descrição: Geometry conventions -- X-ray source and optics -- X-ray detectors -- Goniometer and sample stages -- Data treatment -- Phase identification -- Texture analysis -- Stress measurement -- Small-angle x-ray scattering -- Combinatorial screening -- Quantitative analysis -- Innovation and future development.
    "Two-Dimensional X-Ray Diffraction shows how two-dimensional X-ray diffraction can be a useful tool for the examination of metals, polymers, semiconductors, thin films, coatings, paints, biomaterials and composites for material science researches, molecular structure determination and polymorphism study for drug discovery and processing, and samples with micro volume or micro-area for forensic analysis, and archaeology analysis, to name just a few of the method's applications. Researchers in materials science, chemistry, physics, pharmaceuticals, and related fields will find this introductory reference invaluable in understanding and applying two-dimensional X-ray diffraction for examining a broad range of samples."--BOOK JACKET.
  • Editor: Hoboken, N.J. Wiley
  • Data de criação/publicação: c2009
  • Formato: xiv, 426 p ill. 25 cm.
  • Idioma: Inglês
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  • Realização: ABCD-USP USP   Logos de Redes Sociais: Freepik

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