Advances in X-ray analysis Volume 32
C. S Barrett 1902- (Charles Sanborn); University of Denver Dept. of Engineering; JCPDS--International Centre for Diffraction Data; Conference on Applications of X-ray Analysis (37th 1988 Steamboat Springs, Colo.)
New York Plenum Press c1989
Localização: EEL - Engenharia de Materiais (543.42 B274a ) e outros locais(Acessar)
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543.42 b745c 2 ed.
543.33 g855f
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