Methodology for accurate extrapolation of InGaP/GaAs HBT safe operating area (SOA) for variations in emitter area and ballast resistor size

Howell, Robert S. ; Lewis, Randall ; Henry, H. George ; Hearne, Harold ; Brown, Deas ; Dawson, Dale ; Ezis, Andris

Microelectronics and reliability, 2014-12, Vol.54 (12), p.2682-2687 [Periódico revisado por pares]

Kidlington: Elsevier Ltd

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