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Structural characterization of diamond-like carbon films for ultracold neutron applications

Atchison, F. ; Bryś, T. ; Daum, M. ; Fierlinger, P. ; Foelske, A. ; Gupta, M. ; Henneck, R. ; Heule, S. ; Kasprzak, M. ; Kirch, K. ; Kötz, R. ; Kuźniak, M. ; Lippert, T. ; Meyer, C.-F. ; Nolting, F. ; Pichlmaier, A. ; Schneider, D. ; Schultrich, B. ; Siemroth, P. ; Straumann, U.

Diamond and related materials, 2007-02, Vol.16 (2), p.334-341 [Periódico revisado por pares]

Amsterdam: Elsevier B.V

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Título:
Structural characterization of diamond-like carbon films for ultracold neutron applications
Autor: Atchison, F. ; Bryś, T. ; Daum, M. ; Fierlinger, P. ; Foelske, A. ; Gupta, M. ; Henneck, R. ; Heule, S. ; Kasprzak, M. ; Kirch, K. ; Kötz, R. ; Kuźniak, M. ; Lippert, T. ; Meyer, C.-F. ; Nolting, F. ; Pichlmaier, A. ; Schneider, D. ; Schultrich, B. ; Siemroth, P. ; Straumann, U.
Assuntos: Characterization methods ; Condensed matter: electronic structure, electrical, magnetic, and optical properties ; Condensed matter: structure, mechanical and thermal properties ; Cross-disciplinary physics: materials science; rheology ; Diamond-like carbon ; Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures ; Exact sciences and technology ; Fullerenes and related materials; diamonds, graphite ; Laser arc deposition ; Materials science ; Methods of deposition of films and coatings; film growth and epitaxy ; Physics ; sp 3 bonding ; Specific materials ; Structure and morphology; thickness ; Surface and interface electron states ; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) ; Thin film structure and morphology ; Ultracold neutrons ; Vacuum deposition
É parte de: Diamond and related materials, 2007-02, Vol.16 (2), p.334-341
Notas: ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
Descrição: We have produced hydrogen-free diamond-like carbon (DLC) films by vacuum arc deposition for use as wall coating material in ultracold neutron (UCN) applications. The sp 3 fraction, the main quality factor for DLC used in UCN applications, was varied from 0.4 to 0.9, the coating thickness between 10 nm and 120 nm. The samples were characterized by using X-ray Absorption Near-Edge Spectroscopy (XANES), X-ray induced Photoelectron Spectroscopy (XPS), Laser induced surface Acoustic Waves (LAwave), cold neutron reflectometry and Raman spectroscopy at visible excitation wavelength. We observe reasonable agreement between the different results for film thicknesses below 20 nm. For larger thickness, we find that the surface-sensitive methods XPS and XANES yield smaller sp 3 fractions (by up to 20%) than the bulk-sensitive LAwave, being consistent with the assumption of a lower-density surface layer on a nominal-density bulk layer.
Editor: Amsterdam: Elsevier B.V
Idioma: Inglês

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Structural characterization of diamond-like carbon films for ultracold neutron applications

Atchison, F. ; Bryś, T. ; Daum, M. ; Fierlinger, P. ; Foelske, A. ; Gupta, M. ; Henneck, R. ; Heule, S. ; Kasprzak, M. ; Kirch, K. ; Kötz, R. ; Kuźniak, M. ; Lippert, T. ; Meyer, C.-F. ; Nolting, F. ; Pichlmaier, A. ; Schneider, D. ; Schultrich, B. ; Siemroth, P. ; Straumann, U.

Amsterdam: Elsevier B.V

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