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10 and 5 {mu}m pinhole-assisted point-projection backlit imaging for the National Ignition Facility

Bullock, A. B. ; Landen, O. L. ; Bradley, D. K.

Review of scientific instruments, 2001-01, Vol.72 (1) [Periódico revisado por pares]

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Título:
10 and 5 {mu}m pinhole-assisted point-projection backlit imaging for the National Ignition Facility
Autor: Bullock, A. B. ; Landen, O. L. ; Bradley, D. K.
Assuntos: 70 PLASMA PHYSICS AND FUSION TECHNOLOGY ; ABLATION ; CLOSURES ; LASERS ; PHYSICS ; US NATIONAL IGNITION FACILITY
É parte de: Review of scientific instruments, 2001-01, Vol.72 (1)
Notas: US
Descrição: In pinhole-assisted point-projection backlighting, pinholes are placed a small distance (of order 1 mm) away from the backlighter source to produce images with large field of view. Pinholes placed close to high-power backlighter sources can vaporize and, if sufficiently small, close due to x-ray driven ablation, thereby potentially limiting the usefulness of this method. A study of streaked one-dimensional backlit imaging of 25 {mu}m W wires using the OMEGA laser at the University of Rochester is presented. The pinhole closure time scale for 10 {mu}m pinholes placed 0.45 and 1 mm distant from a 0.6 TW Ti backlighter is 1.3 and 2.2 ns, respectively. Similar time scales for 5 {mu}m pinholes is also presented. Successful wire imaging prior to pinhole closure is clearly demonstrated.
Editor: United States: The American Physical Society
Idioma: Inglês

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