Quantitative analysis of variable‐angle total internal reflection fluorescence microscopy (VA‐TIRFM) of cell/substrate contacts

BURMEISTER, J. S. ; TRUSKEY, G. A. ; REICHERT, W. M.

Journal of microscopy (Oxford), 1994-01, Vol.173 (1), p.39-51 [Periódico revisado por pares]

Oxford, UK: Blackwell Publishing Ltd

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