Process Variation Aware Analysis of SRAM SEU Cross Sections Using Data Retention Voltage

Kobayashi, Daisuke ; Hayashi, Naoki ; Hirose, Kazuyuki ; Kakehashi, Yuya ; Kawasaki, Osamu ; Makino, Takahiro ; Ohshima, Takeshi ; Matsuura, Daisuke ; Mori, Yoshiharu ; Kusano, Masaki ; Narita, Takanori ; Ishii, Shigeru ; Masukawa, Kazunori

IEEE transactions on nuclear science, 2019-01, Vol.66 (1), p.155-162 [Periódico revisado por pares]

New York: IEEE

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