IR study of exclusion-accumulation effects enhanced by the geometrical factor
Malyutenko, V K ; Teslenko, G I ; Vainberg, V V ; Piotrowski, T ; Pultorak, J
Semiconductor science and technology, 2000-11, Vol.15 (11), p.1054-1060 [Periódico revisado por pares]Bristol: IOP Publishing
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