Elemental thin film depth profiles by using self-consistent ion beam analysis – MultiSIMNRA a new computational tool

Cleber Lima Rodrigues Marcia de Almeida Rizzutto; Tiago Fiorini da Silva; B M Mayer; Nemitala Added; Marcia de Almeida Rizzutto; Manfredo Harri Tabacniks; Encontro de Física ( 2016 Natal, RN, Brasil ); National Meeting on Condensed Matter Physics ( 2016 Natal, RN, Brasil 39 )

Posters - Resumo São Paulo: SBF, 2016

São Paulo SBF 2016

Acesso online