skip to main content

A Survey of Fault Diagnosis and Fault-Tolerant Techniques-Part I: Fault Diagnosis With Model-Based and Signal-Based Approaches

Zhiwei Gao ; Cecati, Carlo ; Ding, Steven X.

IEEE transactions on industrial electronics (1982), 2015-06, Vol.62 (6), p.3757-3767 [Periódico revisado por pares]

New York: IEEE

Texto completo disponível

Citações Citado por
  • Título:
    A Survey of Fault Diagnosis and Fault-Tolerant Techniques-Part I: Fault Diagnosis With Model-Based and Signal-Based Approaches
  • Autor: Zhiwei Gao ; Cecati, Carlo ; Ding, Steven X.
  • Assuntos: Abnormalities ; Analytical redundancy ; Control systems ; Dangerous ; Fault diagnosis ; Fault tolerance ; Fault tolerant systems ; Kalman filters ; model-based fault diagnosis ; Observers ; Performance degradation ; Real time ; real-time monitoring ; Redundancy ; signal-based fault diagnosis ; Tolerances
  • É parte de: IEEE transactions on industrial electronics (1982), 2015-06, Vol.62 (6), p.3757-3767
  • Notas: ObjectType-Article-1
    SourceType-Scholarly Journals-1
    ObjectType-Feature-2
    content type line 23
  • Descrição: With the continuous increase in complexity and expense of industrial systems, there is less tolerance for performance degradation, productivity decrease, and safety hazards, which greatly necessitates to detect and identify any kinds of potential abnormalities and faults as early as possible and implement real-time fault-tolerant operation for minimizing performance degradation and avoiding dangerous situations. During the last four decades, fruitful results have been reported about fault diagnosis and fault-tolerant control methods and their applications in a variety of engineering systems. The three-part survey paper aims to give a comprehensive review of real-time fault diagnosis and fault-tolerant control, with particular attention on the results reported in the last decade. In this paper, fault diagnosis approaches and their applications are comprehensively reviewed from model- and signal-based perspectives, respectively.
  • Editor: New York: IEEE
  • Idioma: Inglês

Buscando em bases de dados remotas. Favor aguardar.