Comparison of thermal runaway limits under different test conditions based on a 4.5kV IGBT
Reigosa, P.D. ; Prindle, D. ; Pâques, G. ; Geissmann, S. ; Iannuzzo, F. ; Kopta, A. ; Rahimo, M.
Microelectronics and reliability, 2016-09, Vol.64, p.524-529 [Periódico revisado por pares]Elsevier Ltd
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