Idioma:

Accurate fitting of measured reflectances using a Shifted Gamma micro-facet distribution

Bagher, M. M. ; Soler, C. ; Holzschuch, N.

Computer graphics forum, 2012-06, Vol.31 (4), p.1509-1518 [Periódico revisado por pares]

Oxford, UK: Blackwell Publishing Ltd

Texto completo disponível

Citações Citado por

Enviar para

Título:
Accurate fitting of measured reflectances using a Shifted Gamma micro-facet distribution
Autor: Bagher, M. M. ; Soler, C. ; Holzschuch, N.
Assuntos: and texture ; Computer graphics ; Computer Science ; Fittings ; Graphics ; http://www.acm.org/class/1998/ I.3.7 [Computer Graphics]: Three-Dimensional Graphics and Realism-Color ; http://www.acm.org/class/1998/ I.3.7 [Computer Graphics]: Three‐Dimensional Graphics and Realism—Color, shading, shadowing, and texture ; Image processing systems ; shading ; shadowing ; Studies
É parte de: Computer graphics forum, 2012-06, Vol.31 (4), p.1509-1518
Notas: istex:E245B1AB72A2F0C71B937C87D663D9FC6F7C0BD5
ark:/67375/WNG-0MXCQHL9-V
ArticleID:CGF3147
ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
Descrição: Material models are essential to the production of photo‐realistic images. Measured BRDFs provide accurate representation with complex visual appearance, but have larger storage cost. Analytical BRDFs such as Cook‐Torrance provide a compact representation but fail to represent the effects we observe with measured appearance. Accurately fitting an analytical BRDF to measured data remains a challenging problem. In this paper we introduce the SGD micro‐facet distribution for Cook‐Torrance BRDF. This distribution accurately models the behavior of most materials. As a consequence, we accurately represent all measured BRDFs using a single lobe. Our fitting procedure is stable and robust, and does not require manual tweaking of the parameters.
Editor: Oxford, UK: Blackwell Publishing Ltd
Idioma: Inglês

Links

View record in HAL

Voltar para lista de resultados

Realização: Logos de Redes Sociais:

Accurate fitting of measured reflectances using a Shifted Gamma micro-facet distribution

Bagher, M. M. ; Soler, C. ; Holzschuch, N.

Oxford, UK: Blackwell Publishing Ltd

Buscando em bases de dados remotas. Favor aguardar.