Idioma:

Diffraction and imaging techniques in material science

S Amelinckx (Severin); R Gevers; J. van Landuyt; International Summer Course on Material Science (1969 Antwerp, Belgium)

Localização: IF - Instituto de Física (578 D569 2.ed. v.2 ex.2 )(Acessar)

Título:
Diffraction and imaging techniques in material science
Autor: S Amelinckx (Severin); R Gevers; J. van Landuyt; International Summer Course on Material Science (1969 Antwerp, Belgium)
Assuntos: Electron microscopy -- Congresses; Electrons -- Diffraction -- Congresses; Imaging systems -- Congresses; MICROSCÓPIO ELETRÔNICO (CONGRESSOS); Materials Structure Determination Applications of diffraction; Materials Structure Determination Imaging systems - Conference proceedings
Notas: Includes bibliographical references and index
Descrição: v. 1. Electron microscopy.--v. 2. Imaging and diffraction techniques
Editor: Amsterdam North-Holland Pub. Co. : sole distributors for the U.S.A. and Canada, Elsevier North-Holland New York
Data de criação/publicação: 1978
Formato: 2 v. (xvii, 847 p., [1] fold. leaf of plates) ill. 23 cm.
Idioma: Inglês

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