Effectiveness of Non-Local Means Algorithm with an Industrial 3 MeV LINAC High-Energy X-Ray System for Non-Destructive Testing
Kim, Kyuseok ; Choi, Jaegu ; Lee, Youngjin
Sensors (Basel, Switzerland), 2020-05, Vol.20 (9), p.2634 [Periódico revisado por pares]Switzerland: MDPI
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